Bruker Advanced X-Ray Solutions: Madison, Wisconsin, USA, 2012-2013. This is performed to maintain the high quality of research data that both faculty and users are expecting and requiring from these instruments.U. Use is monitored - you will be required to show sufficient use on the instruments otherwise a refresher with a staff member to maintain your training level and evening hours use. Please consider as many potential aspects of your research as possible when meeting with the staff, the staff is available to sit down with all involved to give input. However, all new users will have to go through a final check out with a staff member, regardless of who trained them. This listing will be made available to users, as those proficient can train each other as well. JEOL 2000 FX) 8 -10 Sessions 3 hrs each) 8 -10 Sessions 2 hrs each, not EDS and CL) 4 Sessions 2 hrs each, not EDS and EBSD) 1 Session 2 hours) 2 sessions 2 hrs each) 1 Session (2 hours) 5 Sessions 1 hour each) Operated by Michal Sabat Notes: Users need to be trained and "checked out" before they can utilize the machines solo during day and evening hours. Nanoscale Materials Characterization Facility Instrument Training Instrument FEI FIB FEI Titan JEOL 2000 FX JEOL 6700 F JEOL 840 General Optical Hirox KH 7700 Scintag X 1 XRD Scintag XDS XRD Rigaku 3000 SAXS Bruker Apex II XRD Room # MSE 112 WDH B 13 MSE 108 MSE 116 MSE 115 MSE 117 MSE 102 MSE 114 MSE 100 Capabilities Sectioning / SEM STEM / EDS / EELS TEM / EDS SEM / EDS / CL SEM / EDS / EBSD General Metallurgy, Stereo Optical: 3 -D, Movie, 360 rotation Powder XRD / Texture Powder XRD / General Use Small-Angle X-Ray Scattering Crystal Structure Determination Training Time 1, 2 8 -10 Sessions hrs each) 4 -6 Sessions (pre req. Determine the properties of chain packing in natural and synthetic polymers. XRD: X-ray Scattering and Diffraction: Measure the average spacings between layers or rows of atoms Determine the orientation of a single crystal or grain Find the crystal structure of an unknown material Measure the size, shape and internal stress of small crystalline regions.
STEM / TEM: Scanning / Transmission Electron Microscopy: Microstructural and crystallographic information Composition.
SEM: Scanning Electron Microscopy: Topography Morphology Composition Crystallographic Information. EDS: Energy Dispersive Spectroscopy: Elemental analysis OM: Optical Light Microscopy: Morphology Size Transparency Color (reflected and transmitted), Refractive Indices, Dispersion of Refractive Indices, Pleochroism, Crystal System, Birefringence, Extinction Angle, Fluorescence (UV, V, IR), Melting Point, Polymorphism, Eutectics. Data were collected in 0.5 oscillations with 10 second exposures. The data were collected at a temperature of 100(2) K with a theta range for data collection of 1.37 to 26.31. CL: Cathodoluminescence: Luminescent materials, mapping of defects and measurement of their densities, impurity segregation studies Electronic band structure (band gap) Measurement of the dopant concentration and of the minority carrier diffusion length and lifetime EBL: Electron Beam Lithography: Patterning of polymeric substrates and polymer thin films E-Beam Lithography (EBL): http: //com/ EBSD: Electron Backscatter Diffraction: Phase identification, orientation, mapping. made on a Bruker APEX-II CCD diffractometer with graphite monochromated Mo-K radiation. Nanoscale Materials Characterization Facility Technique Application Areas AES: Scanning Auger Electron Spectroscopy: Surface analysis and depth profiling, semi-conducting or conducting samples. Optical: Conventional and 3 -D imaging systems AES: Scanning Auger electron Spectroscopy (August 2010) TEM: Transmission electron microscopy (STEM August 2010) XRD: X-ray diffraction (single crystals, powders, texture) SAXS/WAXS: Small/Wide angle X-ray scattering
The SMART consists of an X-ray source, a CCD detector and a three-circle goniometer. 1 wt% CL: Cathodoluminescence on 6700 F SEM EDS: Energy dispersive spectroscopy FIB: Focused Ion Beam SEM: Scanning electron microscopy TDS: Temperature Desorption. CCD diffractometers are now used ubiquitously in chemical crystallography, and in this paper we describe some practical experience in the application of one such instrument, a BrukerNonius SMART APEX diffractometer, in high-pressure diffraction. S-TEM Microstructural / Crystallographic Information Transmitted and Diffracted Electron - 30 nm 0. Nanoscale Materials Characterization Facility Analytical Technique Summary Technique Application Signal Detected Element Detected Organic Detection Limits Depth Resolution Imaging / Mapping Lateral Resolution SEM High Magnification, Topography Secondary and Backscattered Electrons - Dependent on KV and Imaging Mode (20 Ǻ to a few μm ) Yes 10 to 500 Ǻ for S.
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